Electron Microscope Specimen Mounts and Holders
Electron Microscopy Sciences Multi Holder for 8 Pin Stubs, 3.2 mm x 8mm Pin
This 50 mm in diameter multi pin holder is designed to save time.It is made from machined aluminum with stainless steel Allen wrench screws. It accommodates up to eight standard 12.7 mm (1/2") pin stubs.
Type: 3.2 mm
Electron Microscopy Sciences Multi Holder for 8 Pins, Hitachi M4
This 50 mm in diameter multi pin holder is designed to save time.It is made from machined aluminum with stainless steel Allen wrench screws. It accommodates up to eight standard 12.7 mm (1/2") pin stubs.
Type: Hitachi M4
Electron Microscopy Sciences Geological Thin Section Holder 9.5 mm
This thin section holder is made from aluminum with copper clips and brass screws. The unit measures 55x30x8 mm and holds a standard geological thin section or slide measuring 47 x 27 mm. The holder comes complete with 2 clips to insure nothing moves. The holder has convenient tweezer inserts which allow for easy loading.
Electron Microscopy Sciences Multi Pin Holder 3.2 mm (1/8") for 49 stubs
This 117 mm in diameter multi pin holder is designed to save time It is made from machined aluminum with 302 stainless steel springs that hold the pin stubs in place. It accommodates up to forty nine standard 12.7 mm (1/2") pin stubs.
Electron Microscopy Sciences Calibration Specimen 150-1D, Choose a mount
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. Has a nominal period (pitch) of 150 nm, one dimensional, fabricated on a transparent substrate (Aluminum lines on glass).
Mount: Choose a mount
Electron Microscopy Sciences Calibration Specimen 300-2D, Choose a mount
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. Array of Posts. Pitch 297. Al bumps on Si. Use contact or TappingMode.
Mount: Choose a mount
Electron Microscopy Sciences PS 150 XO Calibration Slide
All of the PS-XO series of Calibration Slides are made with Green Float Glass and have a bright Chrome Image High definition 150mm scale in 0.1mm divisions with extended 0.5mm, 1.0mm and 5.0mm lines. Series of dots and crosses, at 10mm intervals.
Electron Microscopy Sciences Standard Pin SEM Stub 9-Division 25 mm Head with 9 mm Pin, Aluminum, 3.2 mm Pin diameter
9 divisions surface min stub mounts are for use with FEI/Philips, ZEISS/LEO, Cambridge, Leica, Amray, Tescan and Camscan SEMs. Mounts are made from lathe finished ultra-pure aluminum.
Head: 1"
Pin height: 9 mm
Pin diameter: 3.2 mm
Electron Microscopy Sciences Hitachi M4 SEM Cylinder Mount 1-1/4" surface, 1/4" height, Aluminum
Hitachi M4 SEM mounts are made from lathe finished ultra-pure aluminum.
Head: 1-1/4
Pin height: 1/4"
Electron Microscopy Sciences Hitachi M4 SEM Cylinder Mount 1-1/4" surface with 12 Divisions, 1/4" height, Aluminum
Hitachi M4 Thread SEM mounts made from lathe finished ultra-pure aluminum.
Head: 1-1/4"
Height: 1/4"
Electron Microscopy Sciences Standard Pin SEM Stub 3-Division 1/2" Head with 9 mm Pin, Aluminum, 3.2 mm Pin diameter
3-Division surface pin stub mounts are for use with FEI/Philips, ZEISS/LEO, Cambridge, Leica, Amray, Tescan and Camscan are made from lathe finished ultra-pure aluminum.
Head: 1/2"
Pin height: 9 mm
Pin diameter: 3.2 mm
Electron Microscopy Sciences Hitachi M4 SEM Cylinder Mount 5/8" surface, 3/8" height, Aluminum
Hitachi M4 Thread SEM mounts made from lathe finished ultra-pure aluminum.
Head: 5/8"
Height: 3/8"
Electron Microscopy Sciences SEM Cylinder Mount 45° Angle 5/8" Surface, Aluminum
Scanning electron microscope specimen mount with 45 degree angle. Made from lathe finished ultra-pure aluminum.
Head: 5/8"
Height: 3/8"
Electron Microscopy Sciences JEOL SEM Cylinder Mount 1-1/4" surface, 3/16" height, Aluminum
Cylinder specimen mounts are for use with JEOL scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 1-1/4"
Height: 3/16"
Electron Microscopy Sciences Variable Tilt Mount, Hitachi M4
This mount which is made from aluminum is used for the mounting and tilting of samples from 0 – 90 degrees as well as for SEM investigation with small working distances. The mount is marked for 30, 45, 70 and 90 degress. The table measures 11 x 11 mm (0.46" x0.46")and the overall size is 14 x 14 x12.7 mm
Type: Hitachi M4